![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
Author: Liang Peipei Cai Hua Li Yanli Yang Xu You Qinghu Sun Jian Xu Ning Wu Jiada
Publisher: IOP Publishing
E-ISSN: 1361-6463|48|24|245203-245212
ISSN: 0022-3727
Source: Journal of Physics D: Applied Physics, Vol.48, Iss.24, 2015-06, pp. : 245203-245212
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
By Hong J. Lambers E. S. Abernathy C. R. Pearton S. J. Shul R. J. Hobson W. S.
Critical Reviews in Solid State and Material Sciences, Vol. 23, Iss. 4, 1998-12 ,pp. :
![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
By An Youngseo Mahata Chandreswar Lee Changmin Choi Sungho Byun Young-Chul Kang Yu-Seon Lee Taeyoon Kim Jiyoung Cho Mann-Ho Kim Hyoungsub
Journal of Physics D: Applied Physics, Vol. 48, Iss. 41, 2015-10 ,pp. :
![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
![](/images/ico/o.png)
![](/images/ico/ico5.png)
Ellipsometric characterization of AlN films synthesized by Pulsed-Laser-Deposition
Journal of Physics: Conference Series , Vol. 253, Iss. 1, 2010-11 ,pp. :