Kinetics of catastrophic optical damage in GaN-based diode lasers

Author： HempelMartin   TommJens W   StojetzBernhard   KönigHarald   StraussUwe   ElsaesserThomas  

Publisher： IOP Publishing

E-ISSN： 1361-6641|30|7|72001-72006

ISSN： 0268-1242

Source： Semiconductor Science and Technology, Vol.30, Iss.7, 2015-07, pp. : 72001-72006

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