Fracture Strain of SiC Nanowires and Direct Evidence of Electron‐Beam Induced Amorphisation in the Strained Nanowires

Publisher： John Wiley & Sons Inc

E-ISSN： 1613-6829|11|14|1672-1676

ISSN： 1613-6810

Source： SMALL, Vol.11, Iss.14, 2015-04, pp. : 1672-1676

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