Mesoscale Characterization of Nanoparticles Distribution Using X‐ray Scattering

By  

ANGEWANDTE CHEMIE INTERNATIONAL EDITION, Vol. 54, Iss. 40, 2015-09 ,pp. : 11804-11808

John Wiley & Sons Inc

Access to resources Recommend Favorite

Generation and characterization of a bright X-ray source using picosecond laser

By Batani D.   Desai T.   Lucchini G.   Canova F.   Magunov A. I.   Faenov A. Ya.   Pikuz T. A.   Skobelev I. Yu.   Chiodini N.  

Radiation Effects and Defects in Solids, Vol. 160, Iss. 10-12, 2005-10 ,pp. : 507-514

Taylor & Francis Ltd

Access to resources Recommend Favorite

Characterization of Different Shaped Nanocrystallites using X‐ray Diffraction Line Profiles

By  

PARTICLE & PARTICLE SYSTEMS CHARACTERIZATION (ELECTRONIC), Vol. 934-0866, Iss. 1‐2, 2011-04 ,pp. : 19-24

John Wiley & Sons Inc

Access to resources Recommend Favorite

Characterization for morphology of thin deposited Fe, Fe 2 O 3 and Cr 2 O 3 films on silicon wafer using grazing incidence X-ray scattering

By Kosaka T.   Suzuki S.   Saito M.   Waseda Y.   Matsubara E.   Sadamori K.   Aoyagi E.  

Thin Solid Films, Vol. 289, Iss. 1, 1996-11 ,pp. : 74-78

Elsevier

Access to resources Recommend Favorite

Bimodal size distribution in p - porous silicon studied by small angle X-ray scattering

By Binder M.   Edelmann T.   Metzger T.H.   Peisl J.   Mauckner G.   Goerigk G.  

Thin Solid Films, Vol. 276, Iss. 1, 1996-04 ,pp. : 65-68

Elsevier

Access to resources Recommend Favorite