Representational analysis of extended disorder in atomistic ensembles derived from total scattering data

Publisher： John Wiley & Sons Inc

E-ISSN： 1600-5767|48|5|1560-1572

ISSN： 0021-8898

Source： JOURNAL OF APPLIED CRYSTALLOGRAPHY (ELECTRONIC), Vol.48, Iss.5, 2015-10, pp. : 1560-1572

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