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Diffraction analysis of strongly inhomogeneous residual stress depth distributions by modification of the stress scanning method. II. Experimental implementation
Publisher: John Wiley & Sons Inc
E-ISSN: 1600-5767|48|5|1462-1475
ISSN: 0021-8898
Source: JOURNAL OF APPLIED CRYSTALLOGRAPHY (ELECTRONIC), Vol.48, Iss.5, 2015-10, pp. : 1462-1475
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