Problem of elastic anisotropy and stacking faults in stress analysis using multireflection grazing‐incidence X‐ray diffraction

Publisher: John Wiley & Sons Inc

E-ISSN: 1600-5767|48|2|492-509

ISSN: 0021-8898

Source: JOURNAL OF APPLIED CRYSTALLOGRAPHY (ELECTRONIC), Vol.48, Iss.2, 2015-04, pp. : 492-509

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Abstract