Problem of elastic anisotropy and stacking faults in stress analysis using multireflection grazing‐incidence X‐ray diffraction

Publisher： John Wiley & Sons Inc

E-ISSN： 1600-5767|48|2|492-509

ISSN： 0021-8898

Source： JOURNAL OF APPLIED CRYSTALLOGRAPHY (ELECTRONIC), Vol.48, Iss.2, 2015-04, pp. : 492-509

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