X‐Ray Photoelectron Spectroscopy Investigations of the Surface Reaction Layer and its Effects on the Transformation Properties of Nanoscale Ti51Ni38Cu11 Shape Memory Thin Films

Publisher： John Wiley & Sons Inc

E-ISSN： 1527-2648|17|5|669-673

ISSN： 1438-1656

Source： ADVANCED ENGINEERING MATERIALS (ELECTRONIC), Vol.17, Iss.5, 2015-05, pp. : 669-673

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