Highly porous nanoberyllium for X‐ray beam speckle suppression

Publisher： John Wiley & Sons Inc

E-ISSN： 1600-5775|22|3|796-800

ISSN： 0909-0495

Source： JOURNAL OF SYNCHROTRON RADIATION (ELECTRONIC), Vol.22, Iss.3, 2015-05, pp. : 796-800

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract

Related content

X‐ray pulse wavefront metrology using speckle tracking

By  

JOURNAL OF SYNCHROTRON RADIATION (ELECTRONIC), Vol. 22, Iss. 4, 2015-07 ,pp. : 886-894

John Wiley & Sons Inc

Access to resources Recommend Favorite

Exploring experimental parameter choice for rapid speckle‐tracking phase‐contrast X‐ray imaging with a paper analyzer

By  

JOURNAL OF SYNCHROTRON RADIATION (ELECTRONIC), Vol. 22, Iss. 5, 2015-09 ,pp. : 1279-1288

John Wiley & Sons Inc

Access to resources Recommend Favorite

Focus characterization at an X‐ray free‐electron laser by coherent scattering and speckle analysis

By  

JOURNAL OF SYNCHROTRON RADIATION (ELECTRONIC), Vol. 22, Iss. 3, 2015-05 ,pp. : 599-605

John Wiley & Sons Inc

Access to resources Recommend Favorite

Two‐dimensional in situ metrology of X‐ray mirrors using the speckle scanning technique

By  

JOURNAL OF SYNCHROTRON RADIATION (ELECTRONIC), Vol. 22, Iss. 4, 2015-07 ,pp. : 925-929

John Wiley & Sons Inc

Access to resources Recommend Favorite

Development of a speckle‐based portable device for in situ metrology of synchrotron X‐ray mirrors

By  

JOURNAL OF SYNCHROTRON RADIATION (ELECTRONIC), Vol. 23, Iss. 5, 2016-09 ,pp. : 1131-1136

John Wiley & Sons Inc

Access to resources Recommend Favorite