Large field of view X‐ray microscopy with asymmetric bent crystals and a laboratory source

Publisher： John Wiley & Sons Inc

E-ISSN： 1600-5767|48|3|876-881

ISSN： 0021-8898

Source： JOURNAL OF APPLIED CRYSTALLOGRAPHY (ELECTRONIC), Vol.48, Iss.3, 2015-06, pp. : 876-881

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