JOURNAL OF APPLIED CRYSTALLOGRAPHY (ELECTRONIC),volume 48,issue 3  (06-2015)

Period of time： 2015年3期

Publisher： John Wiley & Sons Inc

Founded in： 1968

Total resources： 19

E-ISSN： 1600-5767|48|3

ISSN： 0021-8898

Subject： P Astronomy and Earth Sciences

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JOURNAL OF APPLIED CRYSTALLOGRAPHY (ELECTRONIC),volume 48,issue 3

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XTOP: high‐resolution X‐ray diffraction and imaging

JOURNAL OF APPLIED CRYSTALLOGRAPHY (ELECTRONIC),volume 48,issue 3 , Vol. 48, Iss. 3, 2015-06 , pp. 620-620

John Wiley & Sons Inc

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Signature of dislocations and stacking faults of face‐centred cubic nanocrystals in coherent X‐ray diffraction patterns: a numerical study

JOURNAL OF APPLIED CRYSTALLOGRAPHY (ELECTRONIC),volume 48,issue 3 , Vol. 48, Iss. 3, 2015-06 , pp. 621-644

John Wiley & Sons Inc

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Characterization of defects in mono‐like silicon for photovoltaic applications using X‐ray Bragg diffraction imaging

JOURNAL OF APPLIED CRYSTALLOGRAPHY (ELECTRONIC),volume 48,issue 3 , Vol. 48, Iss. 3, 2015-06 , pp. 645-654

John Wiley & Sons Inc

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Characterization of dislocations in germanium layers grown on (011)‐ and (111)‐oriented silicon by coplanar and noncoplanar X‐ray diffraction

JOURNAL OF APPLIED CRYSTALLOGRAPHY (ELECTRONIC),volume 48,issue 3 , Vol. 48, Iss. 3, 2015-06 , pp. 655-665

John Wiley & Sons Inc

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Surface‐treated self‐standing curved crystals as high‐efficiency elements for X‐ and γ‐ray optics: theory and experiment

JOURNAL OF APPLIED CRYSTALLOGRAPHY (ELECTRONIC),volume 48,issue 3 , Vol. 48, Iss. 3, 2015-06 , pp. 666-671

John Wiley & Sons Inc

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Inception and movement of a `subgrain boundary precursor' in ice under an applied stress, observed by X‐ray synchrotron radiation Bragg imaging

JOURNAL OF APPLIED CRYSTALLOGRAPHY (ELECTRONIC),volume 48,issue 3 , Vol. 48, Iss. 3, 2015-06 , pp. 672-678

John Wiley & Sons Inc

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Ab initio simulation of diffractometer instrumental function for high‐resolution X‐ray diffraction

JOURNAL OF APPLIED CRYSTALLOGRAPHY (ELECTRONIC),volume 48,issue 3 , Vol. 48, Iss. 3, 2015-06 , pp. 679-689

John Wiley & Sons Inc

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Magnetite nanoparticles for nonradionuclide brachytherapy

JOURNAL OF APPLIED CRYSTALLOGRAPHY (ELECTRONIC),volume 48,issue 3 , Vol. 48, Iss. 3, 2015-06 , pp. 690-692

John Wiley & Sons Inc

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Monochromatic computed microtomography using laboratory and synchrotron sources and X‐ray fluorescence analysis for comprehensive analysis of structural changes in bones

JOURNAL OF APPLIED CRYSTALLOGRAPHY (ELECTRONIC),volume 48,issue 3 , Vol. 48, Iss. 3, 2015-06 , pp. 693-701

John Wiley & Sons Inc

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Quantitative evaluation of microtwins and antiphase defects in GaP/Si nanolayers for a III–V photonics platform on silicon using a laboratory X‐ray diffraction setup

JOURNAL OF APPLIED CRYSTALLOGRAPHY (ELECTRONIC),volume 48,issue 3 , Vol. 48, Iss. 3, 2015-06 , pp. 702-710

John Wiley & Sons Inc

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