Structural investigation of mM Ni(II) complex isomers using transmission XAFS: the significance of model development
Publisher: John Wiley & Sons Inc
E-ISSN: 1600-5775|22|6|1475-1491
ISSN: 0909-0495
Source: JOURNAL OF SYNCHROTRON RADIATION (ELECTRONIC), Vol.22, Iss.6, 2015-11, pp. : 1475-1491
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Abstract