Simulation of the influence of the tip radius on the sensitivity of an atomic force microscope

Author： Pokropivnyi A.   Pokropivnyi V.   Skorokhod V.  

Publisher： MAIK Nauka/Interperiodica

ISSN： 1063-7842

Source： Technical Physics, Vol.42, Iss.12, 1997-12, pp. : 1435-1439

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