Method of monitoring the shape of an atomic force (tunneling) microscope tip using backscattering spectrometry

Author: Dedkov G.   Rekhviashvili S.  

Publisher: MAIK Nauka/Interperiodica

ISSN: 1063-7850

Source: Technical Physics Letters, Vol.23, Iss.6, 1997-06, pp. : 452-453

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