Analysis of the electroluminescence features of silicon metal-insulator-semiconductor structures as a tool for diagnostics of the injection properties of a dielectric layer

Author： Illarionov Yu.   Vexler M.   Isakov D.   Fedorov V.   Sing Yew  

Publisher： MAIK Nauka/Interperiodica

ISSN： 1063-7850

Source： Technical Physics Letters, Vol.39, Iss.10, 2013-10, pp. : 878-882

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