A general simulation procedure for the electrical characteristics of metal-insulator-semiconductor tunnel structures

Author： Vexler M.   Tyaginov S.   Illarionov Yu.   Sing Yew   Shenp Ang   Fedorov V.   Isakov D.  

Publisher： MAIK Nauka/Interperiodica

ISSN： 1063-7826

Source： Semiconductors, Vol.47, Iss.5, 2013-05, pp. : 686-694

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