A unified drain current 1/f noise model for GaN-based high electron mobility transistors

Author: Yu-An Liu   Yi-Qi Zhuang   Xiao-Hua Ma   Ming Du   Jun-Lin Bao   Cong Li  

Publisher: IOP Publishing

ISSN: 1674-1056

Source: Chinese Physics B, Vol.23, Iss.2, 2014-02, pp. : 20701-20706

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