Transmission Electron Microscopy-Based Analysis of Electrically Conductive Surface Defects in Large Area GaSb Homoepitaxial Diodes Grown Using Molecular Beam Epitaxy

Author: Romero O.S.   Aragon A.A.   Rahimi N.   Shima D.   Addamane S.   Rotter T.J.   Mukherjee S.   Dawson L.R.   Lester L.F.   Balakrishnan G.  

Publisher: Springer Publishing Company

ISSN: 1543-186X

Source: Journal of Electronic Materials, Vol.43, Iss.4, 2014-04, pp. : 926-930

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