Related content

A novel SOI high-voltage SJ-pLDMOS based on self-adaptive charge balance

By Lijuan Wu   Wentong Zhang   Bo Zhang   Zhaoji Li  

Journal of Semiconductors, Vol. 35, Iss. 2, 2014-02 ,pp. : 24004-24008

IOP Publishing

Access to resources Recommend Favorite

Investigation of the trigger voltage walk-in effect in LDMOS for high-voltage ESD protection

By Hailian Liang   Shurong Dong   Xiaofeng Gu   Lei Zhong   Jian Wu   Zongguang Yu  

Journal of Semiconductors, Vol. 35, Iss. 9, 2014-09 ,pp. : 94005-94008

IOP Publishing

Access to resources Recommend Favorite

A Low-Cost Test Methodology for Dynamic Specification Testing of High-Speed Data Converters

By Goyal Shalabh   Chatterjee Abhijit   Purtell Michael  

Journal of Electronic Testing, Vol. 23, Iss. 1, 2007-02 ,pp. : 95-106

Springer Publishing Company

Access to resources Recommend Favorite

Selective SWIFT-R: A Flexible Software-Based Technique for Soft Error Mitigation in Low-Cost Embedded Systems

By Restrepo-Calle Felipe   Martínez-Álvarez Antonio   Cuenca-Asensi Sergio   Jimeno-Morenilla Antonio  

Journal of Electronic Testing, Vol. 29, Iss. 6, 2013-12 ,pp. : 825-838

Springer Publishing Company

Access to resources Recommend Favorite

Production Realization of MTPR Test on Low-Cost ATE for OFDM Based Communication Devices

By Srinivasan Ganesh  

Journal of Electronic Testing, Vol. 26, Iss. 4, 2010-08 ,pp. : 405-417

Springer Publishing Company

Access to resources Recommend Favorite