Related content

Experimental research of heavy ion and proton induced single event effects for a Bi-CMOS technology DC/DC converter

By Anlin He   Gang Guo   Shuting Shi   Dongjun Shen   Jiancheng Liu   Li Cai   Hui Fan  

Journal of Semiconductors, Vol. 36, Iss. 11, 2015-11 ,pp. : 115010-115014

IOP Publishing

Access to resources Recommend Favorite

Experimental study on the single event effects in pulse width modulators by laser testing

By Wen Zhao   Xiaoqiang Guo   Wei Chen   Hongxia Guo   Dongsheng Lin   Hanning Wang   Yinhong Luo   Lili Ding   Yuanming Wang  

Journal of Semiconductors, Vol. 36, Iss. 11, 2015-11 ,pp. : 115008-115012

IOP Publishing

Access to resources Recommend Favorite

Design of a bi-directional pulse-current sensor for bi-directional PWM dc-dc converters using an integrated magnetic component

By Wong Leung-Pong   Lee Yim-Shu   Cheng David Ki-Wai  

International Journal of Electronics, Vol. 90, Iss. 8, 2003-08 ,pp. : 495-508

Taylor & Francis Ltd

Access to resources Recommend Favorite

Single event transient pulse width measurement of 65-nm bulk CMOS circuits

By Suge Yue   Xiaolin Zhang   Xinyuan Zhao  

Journal of Semiconductors, Vol. 36, Iss. 11, 2015-11 ,pp. : 115006-115009

IOP Publishing

Access to resources Recommend Favorite

Evaluation of Moderately Focused Laser Irradiation as a Method for Simulating Single-Event Effects

By Chumakov A. I.   Egorov A. N.   Mavritsky O. B.   Yanenko A. V.  

Russian Microelectronics, Vol. 33, Iss. 2, 2004-03 ,pp. : 106-110

MAIK Nauka/Interperiodica

Access to resources Recommend Favorite