Understanding internal stress evolution mechanisms associated with field crystallization of anodic tantalum oxide

Author： Yang Lei   Viste Mark   Hossick-Schott Joachim   Sheldon Brian  

Publisher： Springer Publishing Company

ISSN： 1385-3449

Source： Journal of Electroceramics, Vol.32, Iss.1, 2014-02, pp. : 108-116

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