Study of Microwave Dielectric Properties of Perovskite Thin Films by Near-Field Microscopy

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Characterization of Au/Pb(Zr 0.96 Ti 0.04 )O 3 /Al 2 O 3 /Si antiferroelectric field-effect transistors for memory application

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Modeling of complex oxide materials from the first principles: systematic applications to vanadates R VO 3 with distorted perovskite structure

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Interface Defect Chemistry and Effective Conductivity in Polycrystalline Cerium Oxide

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Journal of Electroceramics, Vol. 14, Iss. 1, 2005-01 ,pp. : 5-23

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Control of crystal polarity in oxide and nitride semiconductors by interface engineering

By Cho M.   Minegishi T.   Suzuk T.   Suzuki H.   Yao T.   Hong S.   Ko Hyunchul  

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