Three‐dimensional α colony characterization and prior‐β grain reconstruction of a lamellar Ti–6Al–4V specimen using near‐field high‐energy X‐ray diffraction microscopy

Publisher： John Wiley & Sons Inc

E-ISSN： 1600-5767|48|4|1165-1171

ISSN： 0021-8898

Source： JOURNAL OF APPLIED CRYSTALLOGRAPHY (ELECTRONIC), Vol.48, Iss.4, 2015-08, pp. : 1165-1171

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