High sensitivity of Franz-Keldysh oscillations in photoreflectance spectra for probing morphology in AlxGa 1−xN/GaN heterostructures

Author： Takeuchi H.   Yamamoto Y.   Kamo Y.   Kunii T.   Oku T.   Wakaiki S.   Nakayama M.  

Publisher： Edp Sciences

E-ISSN： 1286-0050|37|2|119-122

ISSN： 1286-0042

Source： EPJ Applied Physics (The), Vol.37, Iss.2, 2007-01, pp. : 119-122

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