Development of a microwave photoconductance measurement technique for the study of carrier dynamics in highly-excited 4H-SiC

Publisher： IOP Publishing

E-ISSN： 1361-6501|26|12|125014-125021

ISSN： 0957-0233

Source： Measurement Science and Technology, Vol.26, Iss.12, 2015-12, pp. : 125014-125021

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