Two-Dimensional Carrier Profiling on Lightly Doped n-Type 4H-SiC Epitaxially Grown Layers

Publisher: Trans Tech Publications

E-ISSN: 1662-9752|2015|821|269-272

ISSN: 0255-5476

Source: Materials Science Forum, Vol.2015, Iss.821, 2015-07, pp. : 269-272

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Abstract