X-Ray Refraction Techniques for Fast, High-Resolution Microstructure Characterization and Non-Destructive Testing of Lightweight Composites

Publisher： Trans Tech Publications

E-ISSN： 1662-9752|2015|825|814-821

ISSN： 0255-5476

Source： Materials Science Forum, Vol.2015, Iss.825, 2015-08, pp. : 814-821

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