MultiRef: software platform for Rietveld refinement of multiple powder diffractograms from in situ, scanning or diffraction tomography experiments

Publisher: John Wiley & Sons Inc

E-ISSN: 1600-5767|48|6|2019-2025

ISSN: 0021-8898

Source: JOURNAL OF APPLIED CRYSTALLOGRAPHY (ELECTRONIC), Vol.48, Iss.6, 2015-12, pp. : 2019-2025

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Abstract