The influence of the InGaN back-barrier on the properties of Al0.3Ga0.7N/AlN/GaN/InGaN/GaN structure

Author: Bi Y.   Wang X.L.   Xiao H.L.   Wang C.M.   Peng E.C.   Lin D.F.   Feng C.   Jiang L.J.  

Publisher: Edp Sciences

E-ISSN: 1286-0050|55|1|10102-10102

ISSN: 1286-0042

Source: EPJ Applied Physics (The), Vol.55, Iss.1, 2011-07, pp. : 10102-10102

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