Publisher: Edp Sciences
E-ISSN: 1764-7177|03|C3|C3-493-C3-497
ISSN: 1155-4339
Source: Le Journal de Physique IV, Vol.03, Iss.C3, 1993-08, pp. : C3-493-C3-497
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Related content
Properties of thin silicon carbide films prepared by rapid thermal annealing
Journal of Physics: Conference Series , Vol. 356, Iss. 1, 2012-03 ,pp. :
Deposition and Properties of Thin PECVD Carbon Films After Rapid Thermal Annealing
Le Journal de Physique IV, Vol. 05, Iss. C5, 1995-06 ,pp. :
By Bacherikov Yu. Dmitruk N. Konakova R. Kondratenko O. Lytvyn O. Milenin V. Okhrimenko O. Kapitanchuk L. Svetlichnyi A. Polyakov V. Shelcunov A.
Technical Physics, Vol. 52, Iss. 2, 2007-02 ,pp. :