Qualitative and quantitative assessments of the growth of (Al,Ga) As-GaAs heterostructures by in situ ellipsometry

Publisher： Edp Sciences

E-ISSN： 0035-1687|16|10|579-589

ISSN： 0035-1687

Source： Revue de Physique Appliquée (Paris), Vol.16, Iss.10, 1981-10, pp. : 579-589

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