Optimization of Fluorine Plasma Treatment for Interface Improvement on HfO2/In0.53Ga0.47As MOSFETs

Author: Chen Yen-Ting   Wang Yanzhen   Lee Jack C.  

Publisher: MDPI

E-ISSN: 2076-3417|2|1|233-244

ISSN: 2076-3417

Source: Applied Sciences, Vol.2, Iss.1, 2012-03, pp. : 233-244

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Abstract