Comparative Study of Charge Trapping Type SOI-FinFET Flash Memories with Different Blocking Layer Materials

Author: Liu Yongxun   Nabatame Toshihide   Matsukawa Takashi   Endo Kazuhiko   O’uchi Shinichi   Tsukada Junichi   Yamauchi Hiromi   Ishikawa Yuki   Mizubayashi Wataru   Morita Yukinori   Migita Shinji   Ota Hiroyuki   Chikyow Toyohiro   Masahara Meishoku  

Publisher: MDPI

E-ISSN: 2079-9268|4|2|153-167

ISSN: 2079-9268

Source: Journal of Low Power Electronics and Applications, Vol.4, Iss.2, 2014-06, pp. : 153-167

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