Impact of Low-Variability SOTB Process on Ultra-Low-Voltage Operation of 1 Million Logic Gates

Author: Ogasahara Yasuhiro   Nakagawa Tadashi   Sekigawa Toshihiro   Tsutsumi Toshiyuki   Koike Hanpei  

Publisher: MDPI

E-ISSN: 2079-9268|5|2|116-129

ISSN: 2079-9268

Source: Journal of Low Power Electronics and Applications, Vol.5, Iss.2, 2015-05, pp. : 116-129

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Abstract