Impacts of Work Function Variation and Line-Edge Roughness on TFET and FinFET Devices and 32-Bit CLA Circuits

Author: Chen Yin-Nien   Chen Chien-Ju   Fan Ming-Long   Hu Vita Pi-Ho   Su Pin   Chuang Ching-Te  

Publisher: MDPI

E-ISSN: 2079-9268|5|2|101-115

ISSN: 2079-9268

Source: Journal of Low Power Electronics and Applications, Vol.5, Iss.2, 2015-05, pp. : 101-115

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