V-Defect and Dislocation Analysis in InGaN Multiple Quantum Wells on Patterned Sapphire Substrate

Publisher: Trans Tech Publications

E-ISSN: 1662-9795|2018|787|37-41

ISSN: 1013-9826

Source: Key Engineering Materials, Vol.2018, Iss.787, 2018-12, pp. : 37-41

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Abstract