Negative bias illumination stress assessment of indium gallium zinc oxide thin‐film transistors

Publisher: John Wiley & Sons Inc

E-ISSN: 1938-3657|23|5|187-195

ISSN: 1071-0922

Source: JOURNAL OF THE SOCIETY FOR INFORMATION DISPLAY, Vol.23, Iss.5, 2015-05, pp. : 187-195

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract