Author: Hibst N Knittel P Biskupek J Kranz C Mizaikoff B Strehle S
Publisher: IOP Publishing
E-ISSN: 1361-6641|31|2|25005-25011
ISSN: 0268-1242
Source: Semiconductor Science and Technology, Vol.31, Iss.2, 2016-02, pp. : 25005-25011
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Abstract