Simulation and research on a 4T-cell based duplication redundancy SRAM for SEU radiation hardening

Author: Xinhong Hong   Liyang Pan   Wendi Zhang   Dongmei Ji   Dong Wu   Chen Shen   Jun Xu  

Publisher: IOP Publishing

ISSN: 1674-4926

Source: Journal of Semiconductors, Vol.36, Iss.11, 2015-11, pp. : 114003-114007

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract