Effect of film thickness and texture morphology on the physical properties of lead sulfide thin films

Author： Motlagh Z Azadi   Araghi M E Azim  

Publisher： IOP Publishing

E-ISSN： 1361-6641|31|2|25017-25027

ISSN： 0268-1242

Source： Semiconductor Science and Technology, Vol.31, Iss.2, 2016-02, pp. : 25017-25027

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract

Related content

Effect of Ga2O3 buffer layer thickness on the properties of Cu/ITO thin films deposited on flexible substrates

By Huihui Zhuang   Jinliang Yan   Chengyang Xu   Delan Meng  

Journal of Semiconductors, Vol. 35, Iss. 5, 2014-05 ,pp. : 53001-53005

IOP Publishing

Access to resources Recommend Favorite

Effect of sputtering time on physical and electrical properties of ZrO x thin film on Si

By Tedi K.   Cheong K.Y.   Lockman Z.  

Microelectronics International, Vol. 28, Iss. 3, 2011-08 ,pp. : 7-11

Emerald Group Publishing Ltd

Access to resources Recommend Favorite

Dielectric and ferroelectric properties of in-plane lead lanthanum titanate thin films

By Song Z.T.   Chan H.L.W.   Choy C.L.   Lin C.L.  

Microelectronic Engineering, Vol. 66, Iss. 1, 2003-04 ,pp. : 887-890

Elsevier

Access to resources Recommend Favorite

Piezoelectric properties of sputtered PZT films: influence of structure, micro structure, film thickness (Zr,Ti) ratio and Nb substitution

By Remiens D.   Cattan E.   Soyer C.   Haccart T.  

Materials Science in Semiconductor Processing, Vol. 5, Iss. 2, 2002-04 ,pp. : 123-127

Elsevier

Access to resources Recommend Favorite

The effect of In doping on some physical properties of CdS films

By Atay F.   Bilgin V.   Akyuz I.   Kose S.  

Materials Science in Semiconductor Processing, Vol. 6, Iss. 4, 2003-08 ,pp. : 197-203

Elsevier

Access to resources Recommend Favorite