Discrimination between volume and interface traps in C (V) and photo I(V) experiments on 10-30 nm MOS capacitors

E-ISSN： 1286-4897|3|11|2101-2112

ISSN： 1155-4320

Source： Journal de Physique III, Vol.3, Iss.11, 1993-11, pp. : 2101-2112

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