Effect of pressure and stress on blistering induced by hydrogen implantation in silicon

Author： Coupeau C.   Dion E.   David M.-L.   Colin J.   Grilhé J.  

Publisher： Edp Sciences

E-ISSN： 1286-4854|92|1|16001-16001

ISSN： 0295-5075

Source： EPL (EUROPHYSICS LETTERS), Vol.92, Iss.1, 2010-10, pp. : 16001-16001

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

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