Study of GaAs layers grown on Ge substrates by MOVPE and in situ monitored by laser reflectometry

Author： Rebey A.   Habchi M.M.   Benzarti Z.   El Jani B.  

Publisher： Elsevier

ISSN： 0026-2692

Source： Microelectronics, Vol.35, Iss.2, 2004-02, pp. : 179-184

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