Author: Taylor E. Fang F. Oehler F. Edwards P.R. Kappers M.J. Lorenz K. Alves E. McAleese C. Humphreys C.J. Martin R.W.
Publisher: IOP Publishing
ISSN: 0268-1242
Source: Semiconductor Science and Technology, Vol.28, Iss.6, 2013-06, pp. : 65011-65017
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Abstract
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