CBED and LACBED: characterization of antiphase boundaries

Author: Morniroli J.P.   No M.L.   Rodriguez P.P.   San Juan J.   Jezierska E.   Michel N.   Poulat S.   Priester L.  

Publisher: Elsevier

ISSN: 0304-3991

Source: Ultramicroscopy, Vol.98, Iss.1, 2003-12, pp. : 9-26

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