Degradation Mechanisms of the Program Characteristics of 10 nm NAND Flash Memories Due to Cell-to-Cell Interference

Author: Ryu Ju Tae   Kim Tae Whan  

Publisher: American Scientific Publishers

ISSN: 1533-4899

Source: Journal of Nanoscience and Nanotechnology, Vol.13, Iss.9, 2013-09, pp. : 6420-6423

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