Seebeck Coefficient Characterization of Highly Doped n - and p -Type Silicon Nanowires for Thermoelectric Device Applications Fabricated with Top-Down Approach

Author： Kim Jaehyeon   Hyun Younghoon   Park Youngsam   Choi Wonchul   Kim Soojung   Jeon Hyojin   Zyung Taehyeong   Jang Moongyu  

Publisher： American Scientific Publishers

ISSN： 1533-4899

Source： Journal of Nanoscience and Nanotechnology, Vol.13, Iss.9, 2013-09, pp. : 6416-6419

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