Author: Rmwen Liu Yanmei Kong Binbin Jiao Zhigang Li Haiping Shang Dike Lu Chaoqun Gao Dapeng Chen Qingchuan Zhang
Publisher: IOP Publishing
ISSN: 1674-4926
Source: Journal of Semiconductors, Vol.34, Iss.2, 2013-02, pp. : 24005-24010
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Abstract
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