Cross-sectional transmission electron microscopy and scanning tunnelling microscopy applied to investigation of phase segregation in III-V multilayers grown by molecular beam epitaxy

Author： Mccomb D. W.   Okada T.   Weatherly G. C.   Wolkow R. A.   Hulse J. E.  

Publisher： Taylor & Francis Ltd

ISSN： 1362-3036

Source： Philosophical Magazine Letters, Vol.73, Iss.3, 1996-03, pp. : 129-136

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract

Related content

Scanning transmission electron microscopy measurement of bismuth segregation in thin Ga(As,Bi) layers grown by molecular beam epitaxy

By  

CRYSTAL RESEARCH AND TECHNOLOGY (ELECTRONIC), Vol. 50, Iss. 1, 2015-01 ,pp. : 38-42

John Wiley & Sons Inc

Access to resources Recommend Favorite

A cross-sectional high-resolution transmission electron microscopy study of electrodeposited Ni-Cu/Cu multilayers

By Cziraki A.   Pierron-Bohnes V.   Ulhaq-Bouillet C.   Toth-Kadar E.   Bakonyi I.  

Thin Solid Films, Vol. 318, Iss. 1, 1998-04 ,pp. : 239-242

Elsevier

Access to resources Recommend Favorite

X-ray and transmission electron microscopy characterization of twinned CdO thin films grown on a -plane sapphire by metalorganic vapour phase epitaxy

By Martínez-Tomás M.C.   Zúñiga-Pérez J.   Vennéguès P.   Tottereau O.   Muñoz-Sanjosé V.  

Applied Physics A, Vol. 88, Iss. 1, 2007-07 ,pp. : 61-64

Springer Publishing Company

Access to resources Recommend Favorite

Femtosecond laser irradiation of metal and thermal oxide layers on silicon: studies utilising cross-sectional transmission electron microscopy

By Crawford T.H.R.  

Applied Physics A, Vol. 91, Iss. 3, 2008-06 ,pp. : 473-478

Springer Publishing Company

Access to resources Recommend Favorite

Oblique growth of iron thin films on glass: A cross-sectional transmission electron microscopy study

By Frechard P.   Andrieu S.   Chateigner D.   Germi P.   Pernet M.   Hallouis M.  

Thin Solid Films, Vol. 263, Iss. 1, 1995-07 ,pp. : 42-46

Elsevier

Access to resources Recommend Favorite