

Author: Hosokawa Hiroyuki
Publisher: Taylor & Francis Ltd
ISSN: 1362-3036
Source: Philosophical Magazine Letters, Vol.84, Iss.11, 2004-11, pp. : 713-718
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content


Focused ion beam machining and deposition for nanofabrication
Vacuum, Vol. 47, Iss. 5, 1996-05 ,pp. :


Beam scanning effect on focused-ion-beam-induced processing
Radiation Effects and Defects in Solids, Vol. 168, Iss. 7-8, 2013-08 ,pp. :


Dy-Ni alloy metal ion source for focused ion beam implantation
By Melnikov A. Hillmann M. Kamphausen I. Oswald W. Stauche P. Wernhardt R. Wieck A.D.
Vacuum, Vol. 67, Iss. 2, 2002-09 ,pp. :


Ion acoustic microscope based on IMSA-100 focused ion beam system
By Akhmadaliev C. Bischoff L. Teichert J. Kazbekov K.
Vacuum, Vol. 69, Iss. 1, 2002-12 ,pp. :